In plane oriented strontium ferrite thin films described by spin reorientation

Abstract

For the first time, in plane orientation of magnetic easy axis of sputtered strontium hexaferrite thin films has been explained using modified Heisenberg Hamiltonian model with stress induced anisotropy term. The variation of average value of in plane spin component with temperature was plotted in order to determine the temperature at which easy axis is oriented in the plane of the strontium ferrite film. The average value of in plane spin component in this 2-D model reaches zero at one particular temperature. This particular temperature obtained using our theoretical model agrees with the experimental value of the temperature of rf sputtered polycrystalline strontium ferrite thin films deposited on polycrystalline Al2O3 substrates (500°C). This spin reorientation temperature solely depends on the values of energy parameters used in our modified Heisenberg Hamiltonian equation